The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2024
Filed:
Feb. 25, 2022
Palantir Technologies Inc., Denver, CO (US);
Palantir Technologies Inc., Denver, CO (US);
Abstract
An improved unit test framework that validates large datasets generated by a data management system is described herein. Typical unit test frameworks validate functions. However, the improved unit test framework validates the underlying data. For example, after each step of a data transformation process implemented by the data management system, the data management system can execute a data unit test that loads data sets into memory, checks a set of preconditions, and applies unit test logic to the loaded data sets. In some embodiments, the data management system executes the data unit tests asynchronously with the data transformation processes and therefore do not interfere with the data transformation processes. Rather, the data management system generates and transmits a notification when any step of the data transformation process fails a particular data unit test.