The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2024
Filed:
Nov. 14, 2018
Yokogawa Electric Corporation, Tokyo, JP;
Yokogawa Electric Corporation, Tokyo, JP;
Abstract
To easily perform examination of at least one facility based on detection signals of a plurality of sensors installed in the facility. Provided are an examining apparatus, an examining method and a recording medium, including: a group designation acquiring unit to acquire designation of a targeted group including a plurality of targeted sensors to be analyzed among a plurality of sensors installed in at least one facility; a sensor data acquiring unit to acquire sensor data from each targeted sensor included in the targeted group; a learning unit to learn an analysis model by using the sensor data from each targeted sensor included in the targeted group; and an examining unit to examine the facility by using the learned analysis model.