The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2024

Filed:

Aug. 06, 2021
Applicant:

Photon-x, Inc., Kissimmee, FL (US);

Inventors:

Blair Barbour, Windemere, FL (US);

Nicholas Englert, Orlando, FL (US);

Randy Kenneth Chamberlin, Madison, AL (US);

David Theodore Truch, Katy, TX (US);

Assignee:

Photon-X, Inc., Kissimmee, FL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/257 (2018.01); G03B 35/08 (2021.01); G06V 10/10 (2022.01); H04N 13/122 (2018.01); H04N 13/25 (2018.01); H04N 13/275 (2018.01);
U.S. Cl.
CPC ...
G03B 35/08 (2013.01); G06V 10/10 (2022.01); H04N 13/122 (2018.05); H04N 13/25 (2018.05); H04N 13/257 (2018.05); H04N 13/275 (2018.05);
Abstract

In a general aspect, integrated spatial phase imaging is described. In some aspects, an integrated imaging system includes a sensor device and one or more processors. The sensor device is configured to generate a first set of data indicative of a first set of attributes of an object and a second set of data indicative of a second set of attributes of the object. The one or more processors are configured to: generate a first set of primitives based on the first set of data; generate a second set of primitives based on the second set of data; generate a combined data set based on the first set of primitives and the second set of primitives; and determine a plurality of features of the object based on the combined data set.


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