The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2024

Filed:

Dec. 20, 2022
Applicant:

Arizona Board of Regents on Behalf of the University of Arizona, Tucson, AZ (US);

Inventors:

Xin Li, Tucson, AZ (US);

Lars Furenlid, Tucson, AZ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 7/00 (2006.01); G01T 1/20 (2006.01); G01T 1/202 (2006.01); G01T 1/29 (2006.01);
U.S. Cl.
CPC ...
G01T 7/005 (2013.01); G01T 1/2018 (2013.01); G01T 1/202 (2013.01); G01T 1/2964 (2013.01);
Abstract

The present invention provides a method of calibrating gamma-ray and photon counting detectors, including, but not limited to, monolithic crystal detectors. The method of the present invention is based on the observation that measurement of fan beam datasets allows the synthesis of collimated beam data to derive MDRFs by use of an algorithm that finds the common or intersecting data subsets of two or more orthogonal calibration datasets. This makes the calibration process very efficient while still allowing the full benefits of maximum-likelihood event-parameter estimation that incorporates the statistical nature of the light sensor measurements.


Find Patent Forward Citations

Loading…