The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2024

Filed:

Sep. 13, 2018
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Toru Shirai, Tokyo, JP;

Yasuhiro Kamada, Tokyo, JP;

Masahiro Takizawa, Tokyo, JP;

Hisaaki Ochi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/56 (2006.01); G01R 33/34 (2006.01); G01R 33/48 (2006.01); G01R 33/54 (2006.01); G01R 33/561 (2006.01);
U.S. Cl.
CPC ...
G01R 33/5611 (2013.01); G01R 33/34 (2013.01); G01R 33/4822 (2013.01); G01R 33/54 (2013.01);
Abstract

To calculate a high-resolution coil sensitivity distribution that does not depend on a shape or a structure of a subject with high accuracy. An MRI apparatus of the invention includes: a measurement unit that includes a reception coil including a plurality of channels, a measurement unit that measures a nuclear magnetic resonance signal of a subject for every channel of the reception coil; and an image computation unit that creates an image of the subject by using a sensitivity distribution for every channel of the reception coil, and a channel image obtained from the nuclear magnetic resonance signal measured by the measurement unit for every channel. The image computation unit includes a sensitivity distribution calculation unit that calculates a sensitivity distribution on a k-space for every channel by using the channel images and a composite image obtained by combining the channel images.


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