The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2024

Filed:

Jul. 08, 2022
Applicant:

Asahi Intecc Co., Ltd., Seto, JP;

Inventor:

Satoru Nebuya, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/561 (2006.01); G01R 33/56 (2006.01);
U.S. Cl.
CPC ...
G01R 33/561 (2013.01); G01R 33/5608 (2013.01);
Abstract

A measurement apparatus that includes a static magnetic field application part that applies a static magnetic field in a first direction to a measurement subject, a deflection magnetic field application part that applies a deflection magnetic field in a second direction different, to a portion of the measurement subject via a coil, a plurality of magnetic field detection elements respectively detect a magnitude of a magnetic field on the basis of an electromagnetic wave generated and propagated in a portion of the measurement subject due to an application of the deflection magnetic field, a calculation part that calculates an impedance distribution of at least a portion of a region where the electromagnetic wave is propagated inside the measurement subject, and an image information output part that generates and outputs an image showing information about inside the measurement subject.


Find Patent Forward Citations

Nebuya, Satoru. (2024). Measurement apparatus, detection apparatus, and measurement method (U.S. Patent No. 12032049). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12032049

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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