The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2024
Filed:
Jan. 24, 2022
Samsung Electronics Co., Ltd., Suwon-si, KR;
Yongjeong Kim, Cheonan-si, KR;
Jongjin An, Asan-si, KR;
Seonggwon Jang, Asan-si, KR;
Pilho Lee, Asan-si, KR;
Inhoon Jang, Seoul, KR;
Samsung Electronics Co., Ltd., Gyeonggi-do, KR;
Abstract
Provided are a clock conversion device, a test system including the same, and a method of operating the test system. The clock conversion device includes a first clock generator configured to receive a first input clock signal from test logic and generate a first clock signal of which a frequency is multiplied and a phase is locked; a clock conversion circuit configured to receive the first clock signal and generate one or more second clock signals by converting at least one clock characteristic of the first clock signal; and an output selector configured to output any one of the first clock signal and the one or more second clock signals as an output clock signal, wherein the clock conversion device is configured to provide the output clock signal to a device under test (DUT).