The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2024

Filed:

Mar. 17, 2021
Applicant:

Tokyo Institute of Technology, Tokyo, JP;

Inventors:

Yuji Hatano, Tokyo, JP;

Takayuki Iwasaki, Tokyo, JP;

Mutsuko Hatano, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 24/10 (2006.01); G01N 24/00 (2006.01);
U.S. Cl.
CPC ...
G01N 24/10 (2013.01); G01N 24/006 (2013.01);
Abstract

A physical state measurement apparatus includes a main solid material which generates fluorescence by excitation light from a light source part. A microwave application part applies microwaves to the main solid material so as to control an electron state of the main solid material. A detection part detects the physical state of an object to be measured by the fluorescence from the main solid material. A feedback part has a solid material for feedback and a control part and detects a difference in amplitude between operating points on a low-frequency side and a high-frequency side of a lowering portion of a spectrum amplitude centered on a resonance frequency of an electron spin resonance spectrum of fluorescence from the solid material for feedback and feedback-controls the microwave application part such that the difference becomes zero.


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