The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2024
Filed:
Apr. 29, 2021
Universität Für Bodenkultur Wien, Vienna, AT;
Petrus Dominicus Joannes Van Oostrum, Vienna, AT;
Erik Olof Reimhult, Vienna, AT;
Universität für Bodenkultur Wien, Vienna, AT;
Abstract
A method for determining a focal length of a particle in a medium, wherein the method comprises: providing a sample; emitting a coherent light beam to irradiate the sample, wherein a first part of the light beam is scattered by the particle; recording an interference image; computing for a set of positions an electric field from the interference image; generating a representation comprising, for each of said positions, an intensity value of the coherent light beam calculated from the computed electric field; finding two positions, a first of which lies in the sample, a second of which lies in the beam direction behind or in front of said first position; and determining the focal length from the two found positions.