The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2024
Filed:
Mar. 16, 2021
Applicant:
Ricoh Company, Ltd., Tokyo, JP;
Inventors:
Assignee:
RICOH COMPANY, LTD., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29C 64/129 (2017.01); B25J 19/02 (2006.01); B29C 64/209 (2017.01); B29C 64/227 (2017.01); B29C 64/268 (2017.01); B29C 64/286 (2017.01); B29C 64/393 (2017.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01); B33Y 50/02 (2015.01); G01B 11/25 (2006.01);
U.S. Cl.
CPC ...
B29C 64/129 (2017.08); B25J 19/02 (2013.01); B29C 64/209 (2017.08); B29C 64/227 (2017.08); B29C 64/268 (2017.08); B29C 64/286 (2017.08); B29C 64/393 (2017.08); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12); G01B 11/25 (2013.01);
Abstract
A measuring apparatus includes an irradiation device configured to irradiate an object with light; an imaging device configured to capture an image of the object irradiated with the light and generate captured image data; and circuitry. The circuitry is configured to measure the object based on the captured image data generated by the imaging device; and adjust, with a moving mechanism, relative positions among the object, the irradiation device, and the imaging device in response to a determination that the captured image data includes a region satisfying a predetermined condition.