The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2024

Filed:

Dec. 27, 2019
Applicant:

Dexcom, Inc., San Diego, CA (US);

Inventors:

Sebastian Bohm, San Diego, CA (US);

Anna Claire Harley-Trochimczyk, San Diego, CA (US);

Daiting Rong, San Diego, CA (US);

Rui Ma, San Diego, CA (US);

Wenjie Lan, San Diego, CA (US);

Minglian Shi, San Diego, CA (US);

Disha B. Sheth, Oceanside, CA (US);

Nicholas Kalfas, San Diego, CA (US);

Vincent P. Crabtree, San Diego, CA (US);

Kamuran Turksoy, Clarksburg, MD (US);

Assignee:

Dexcom, Inc., San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/1495 (2006.01); A61B 5/00 (2006.01); A61B 5/0537 (2021.01); A61B 5/145 (2006.01); A61B 5/1473 (2006.01); A61B 5/1486 (2006.01); G01N 27/22 (2006.01); G01N 27/24 (2006.01); G01N 33/487 (2006.01); G01N 27/02 (2006.01);
U.S. Cl.
CPC ...
A61B 5/1495 (2013.01); A61B 5/0537 (2013.01); A61B 5/14532 (2013.01); A61B 5/14546 (2013.01); A61B 5/1473 (2013.01); A61B 5/1486 (2013.01); A61B 5/14865 (2013.01); A61B 5/6844 (2013.01); G01N 27/221 (2013.01); G01N 27/24 (2013.01); G01N 33/48707 (2013.01); A61B 5/0004 (2013.01); A61B 5/0031 (2013.01); A61B 2560/0223 (2013.01); A61B 2560/0252 (2013.01); A61B 2560/0276 (2013.01); G01N 27/026 (2013.01);
Abstract

Various examples are directed to systems and methods of and using analyte sensors. An example analyte sensor system comprises an analyte sensor and a hardware device in communication with the analyte sensor. The hardware device may be configured to perform operations comprising applying a first bias voltage to the analyte sensor, the first bias voltage less than an operational bias voltage of the analyte sensor, measuring a first current at the analyte sensor when the first bias voltage is applied, and applying a second bias voltage to the analyte sensor. The operations may further comprise measuring a second current at the analyte sensor when the second bias voltage is applied, detecting a plateau bias voltage using the first current and the second current, determining that the plateau bias voltage is less than a plateau bias voltage threshold, and executing a responsive action at the analyte sensor.


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