The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2024

Filed:

May. 14, 2021
Applicant:

The Regents of the University of Michigan, Ann Arbor, MI (US);

Inventors:

Wei Zhang, Ann Arbor, MI (US);

Xueding Wang, Ann Arbor, MI (US);

Yannis Paulus, Ann Arbor, MI (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/13 (2006.01); A61B 3/10 (2006.01); A61B 5/00 (2006.01); G02B 27/14 (2006.01);
U.S. Cl.
CPC ...
A61B 3/13 (2013.01); A61B 3/102 (2013.01); A61B 5/0095 (2013.01); G02B 27/141 (2013.01);
Abstract

The present invention relates to systems for low-energy (e.g., 1.0 nJ-7.0 nJ) photoacoustic microscopy and methods for employing such systems. In certain embodiments, such systems employ a low-energy nanosecond pulsed laser beam (NPLB), at least two amplifiers, and a data acquisition system with at least three channels to generate at least three digital signals (e.g., which are averaged and normalized to the energy of the NPLB). In other embodiments, provided herein are systems for combined use of photoacoustic microscopy, dye-based microscopy (e.g., with fluorescein), and optical coherence tomography.


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