The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2024
Filed:
Aug. 28, 2018
Topcon Corporation, Tokyo, JP;
Yasufumi Fukuma, Tokyo, JP;
Kazuhiro Oomori, Tokyo, JP;
TOPCON CORPORATION, Tokyo, JP;
Abstract
An ophthalmic microscope including an observation optical system having a first focal point in front of an eye; an objective auxiliary lens positionable on the eye side of an objective lens in the observation optical system or releasable therefrom, a focal point when the objective auxiliary lens is positioned to a second focal point on an anterior ocular eye position; and a front lens positionable further toward the eye side than the first focal point or releasable from the position, a focal point through the eye's crystalline lens when the front lens is set to a third focal point and a posterior ocular segment position of the eye, the objective auxiliary lens set and the front lens released during anterior ocular segment observation, the front lens set and the objective auxiliary lens released during posterior ocular segment observation, without changing a positional relationship between the objective lens and eye.