The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2024
Filed:
Feb. 24, 2021
Nuctech Company Limited, Beijing, CN;
Tsinghua University, Beijing, CN;
Zhiqiang Chen, Beijing, CN;
Yuanjing Li, Beijing, CN;
Xianghao Wu, Beijing, CN;
Haitao Zhang, Beijing, CN;
Jundi Dai, Beijing, CN;
Shaozhi Zhao, Beijing, CN;
Guocheng An, Beijing, CN;
NUCTECH COMPANY LIMITED, Beijing, CN;
Tsinghua University, Beijing, CN;
Abstract
The present disclosure provides a method of determining a distance and a height, including: measuring, a first distance, a second distance and a third distance from the security inspection device to the tested person as well as measuring a first height, a second height and a third height of the tested person; determining, a relationship between the first distance and a minimum distance threshold as well as a maximum distance threshold, a relationship between the second distance and the minimum distance threshold as well as the maximum distance threshold, and a relationship between the third distance and the minimum distance threshold as well as the maximum distance threshold; determining, a final distance from the security inspection device to the tested person and a final height of the tested person; and performing a pixel conversion and a size conversion on the pupil image of the tested person.