The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2024
Filed:
Dec. 12, 2019
Samsung Electronics Co., Ltd., Suwon-si, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
Provided are a measurement method and apparatus using a multiple frequency partial band in a wireless communication system, and an operation method of a terminal for measuring quality of a cell in a wireless communication system, may include: receiving a plurality of beams including a reference signal, the plurality of beams transmitted by using one of a first bandwidth part (BWP) and a second BWP from a base station of the cell; determining a first beam quality measurement value representing quality of plurality of beams transmitted by using the first BWP; determining a second beam quality measurement value representing quality of plurality of beams transmitted by using the second BWP; and determining a cell quality measurement value indicating the quality of the cell, based on the first beam quality measurement value and the second beam quality measurement value.