The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2024

Filed:

May. 20, 2022
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Mark N Gamadia, Campbell, CA (US);

Zhongmin Wang, Cupertino, CA (US);

Moshe Laifenfeld, Haifa, IL;

Yingjun Bai, San Jose, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 23/67 (2023.01);
U.S. Cl.
CPC ...
H04N 23/671 (2023.01); H04N 23/673 (2023.01);
Abstract

Various embodiments disclosed herein include techniques for determining autofocus for a camera on a mobile device. In various instances, a depth imaging system (e.g., a time-of-flight autofocus system (ToF-AF system)) is used to determine distance of a subject in order to determine autofocus for a camera. In some instances, however, the ToF-AF system may be unable to detect a subject that is very close to the camera when the objects are below a minimum detectable distance of the ToF-AF system. In such instances, an existing IR detector outside of the ToF-AF system may be implemented to measure reflected signals from the ToF-AF system. A power ratio may be determined from the reflected signals and used to determine information about the distance of the subject from the camera.


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