The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2024

Filed:

Feb. 18, 2022
Applicant:

Virtek Vision International, Inc., Waterloo, CA;

Inventor:

Kurt D. Rueb, Kitchener, CA;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/239 (2018.01); G01B 11/00 (2006.01); G01B 11/25 (2006.01); G01C 11/02 (2006.01); G01S 17/89 (2020.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
H04N 13/239 (2018.05); G01B 11/002 (2013.01); G01B 11/2545 (2013.01); G01C 11/025 (2013.01); G01S 17/89 (2013.01); G06T 7/0006 (2013.01); G06T 2207/10028 (2013.01);
Abstract

A first projection device includes a first laser projector and a first measurement system. A second projection device includes a second laser projector and a second measurement system. The first projection device and the second projection device is interconnected with a controller. The controller is programmed with computer aided design data representative of a large scale work area and coordinates electronic interaction between the first projection device and the second projection device. The first projection device projects a first indicia that is detectable by the second measurement system and the second projection device projects a second indicia that is detectable by the first measurement system. The controller is adapted for determining relative position within three-dimensional coordinate system of the first projection device to the second projection device from the first indicia detected by the second measurement system and the second indicia detected by the first measurement system.


Find Patent Forward Citations

Loading…