The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2024

Filed:

Sep. 12, 2019
Applicant:

Sony Semiconductor Solutions Corporation, Kanagawa, JP;

Inventors:

Hiroaki Murakami, Kanagawa, JP;

Bo Ma, Kanagawa, JP;

Yusuke Kikuchi, Kanagawa, JP;

Yutaka Tsukano, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/146 (2006.01);
U.S. Cl.
CPC ...
H01L 27/14603 (2013.01); H01L 27/14623 (2013.01); H01L 27/1463 (2013.01); H01L 27/14643 (2013.01);
Abstract

The present technology relates to an imaging element and an electronic apparatus capable of expanding a saturation signal electric charge amount. A first P-type impurity region, a capacitance expanding portion that forms a PN junction surface with a second P-type impurity region and a first N-type impurity region, and the first N-type impurity region are sequentially provided in a depth direction from a surface side where a wiring layer of a semiconductor substrate is laminated. The second P-type impurity region is formed in a stripe on a plane of the capacitance expanding portion that perpendicularly intersects with the depth direction. The stripe is formed, on the plane of the capacitance expanding portion that perpendicularly intersects with the depth direction, in a direction perpendicular to a side where an electrode that reads accumulated electric charge is formed. The present technology can be applied to an imaging element.


Find Patent Forward Citations

Loading…