The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2024

Filed:

Sep. 01, 2021
Applicant:

Kioxia Corporation, Tokyo, JP;

Inventor:

Takashi Watanabe, Yokkaichi, JP;

Assignee:

Kioxia Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/48 (2006.01); H01L 21/02 (2006.01); H01L 21/321 (2006.01); H01L 21/768 (2006.01);
U.S. Cl.
CPC ...
H01L 21/4857 (2013.01); H01L 21/02164 (2013.01); H01L 21/0217 (2013.01); H01L 21/3212 (2013.01); H01L 21/76804 (2013.01); H01L 21/76877 (2013.01); H01L 21/76895 (2013.01);
Abstract

A method of manufacturing a semiconductor device, includes: alternately stacking a first film and a second film on a surface of a semiconductor substrate to form a multilayer film; partially removing the multilayer film to form stacks and a depression between one of the stacks and another one of the stacks and expose an end portion of the surface; forming a first insulating film to fill the depression; forming a first protective film on the stacks, the first insulating film, and the end portion; forming a second insulating film on the first protective film, the second insulating film overlapping at least a part of the other one of the stacks and the end portion; and removing the second insulating film in a thickness direction using chemical mechanical polishing.


Find Patent Forward Citations

Loading…