The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2024

Filed:

Mar. 30, 2021
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventors:

Wenjian Sun, Shanghai, CN;

Ran Qiu, Shanghai, CN;

Xiaoqiang Zhang, Shanghai, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); G01N 30/72 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0072 (2013.01); G01N 30/7206 (2013.01); G01N 30/7233 (2013.01); H01J 49/0036 (2013.01);
Abstract

The invention provides a mass spectrometry analysis method and a mass spectrometry system, including: a first sample separation step, separating a sample by a first sample separation device to obtain first isolates; a second sample separation step, introducing ionized first isolates into a second sample separation device for further separation based on a difference in ion mobility to obtain second isolates; and a mass spectrometry analysis step, performing mass spectrometry detection at least on daughter ions obtained from dissociation of the second isolates; in the second sample separation step, the second sample separation device operates in a filter mode, and screens out and releases ions having ion mobility within a specified range from received second isolates. The mass spectrometry analysis method can improve the dynamic range of mass spectrometry analysis.


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