The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2024

Filed:

Aug. 01, 2023
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Yuta Imai, Tokyo, JP;

Masahiro Sasajima, Tokyo, JP;

Yoshihiro Takahoko, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/14 (2006.01); H01J 37/12 (2006.01); H01J 37/145 (2006.01); H01J 37/15 (2006.01); H01J 37/21 (2006.01); H01J 37/28 (2006.01); H01J 37/141 (2006.01);
U.S. Cl.
CPC ...
H01J 37/145 (2013.01); H01J 37/15 (2013.01); H01J 37/21 (2013.01); H01J 37/12 (2013.01); H01J 37/141 (2013.01); H01J 37/28 (2013.01);
Abstract

A charged particle beam device is provided in which axis adjustment as a superimposing lens is facilitated by aligning an axis of an electrostatic lens resulting from a deceleration electric field with an axis of a magnetic field lens. The charged particle beam device includes: an electron source; an objective lens that focuses a probe electron beam from the electron source on a sample; a first beam tube and a second beam tube through each of which the probe electron beam passes; a deceleration electrode arranged between the first beam tube and a sample; a first voltage source that forms a deceleration electric field for the probe electron beam between the first beam tube and the deceleration electrode by applying a first potential to the first beam tube; and a first moving mechanism that moves a position of the first beam tube.


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