The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2024

Filed:

Jun. 03, 2021
Applicant:

Essence Smartcare Ltd., Herzlia Pituach, IL;

Inventors:

Ilan Hevdeli, Ganei-Tikva, IL;

Boaz Menis, Kibbutz NaAn, IL;

Assignee:

Essence Smartcare Ltd., Herzlia Pituach, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G08B 21/00 (2006.01); G01S 7/41 (2006.01); G01S 13/89 (2006.01); G08B 21/04 (2006.01);
U.S. Cl.
CPC ...
G08B 21/0469 (2013.01); G01S 7/415 (2013.01); G01S 13/89 (2013.01);
Abstract

A method comprising: controlling an active reflected wave detector to measure wave reflections from an environment using a first frame rate to accrue measured wave reflection data for a classifier, after a first amount of time, determining whether a predefined criteria is satisfied, wherein satisfaction of the predefined criteria is indicative of the classifier being likely to successfully identify a fall status of a person in the environment by a second amount of time of accruing measured wave reflection data from the active reflected wave detector, the second amount of time being greater than the first amount of time; in the event that the predefined criteria is not met, the method comprising controlling the active reflected wave detector to accrue measured wave reflection data at a lower second frame rate for classifying the fall status based on measured wave reflection data accrued at the lower second rate.


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