The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2024

Filed:

Nov. 15, 2021
Applicant:

Uif (University Industry Foundation), Yonsei University, Seoul, KR;

Inventors:

Hye Ran Byun, Seoul, KR;

Wonyoung Lee, Seoul, KR;

Minsong Ki, Seoul, KR;

Jewook Lee, Seoul, KR;

Sungho Park, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/73 (2017.01); G06F 18/213 (2023.01); G06N 3/088 (2023.01); G06T 5/20 (2006.01); G06T 7/11 (2017.01); G06T 7/194 (2017.01); G06V 10/25 (2022.01);
U.S. Cl.
CPC ...
G06T 7/73 (2017.01); G06F 18/213 (2023.01); G06N 3/088 (2013.01); G06T 5/20 (2013.01); G06T 7/11 (2017.01); G06T 7/194 (2017.01); G06V 10/25 (2022.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract

A weakly supervised object localization apparatus includes: a feature map generator configured to generate a feature map X by performing a first convolution operation on an input image; an erased feature map generator configured to generate an attention map A through the feature map X and generate an erased feature map −X by performing a masking operation on the input image through the attention map A; a final map generator configured to generate a final feature map F and a final erased feature map −F, respectively, by performing a second convolution operation on the feature map X and the erased feature map −X; and a contrastive guidance determiner configured to determine contrastive guidance for a foreground object in the input image based on the final feature map F and the final erased feature map −F.


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