The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2024

Filed:

Feb. 14, 2019
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventor:

Shinichi Yamaguchi, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/11 (2017.01); G06F 18/23 (2023.01); G06F 18/24 (2023.01); H01J 49/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/11 (2017.01); G06F 18/23 (2023.01); G06F 18/24 (2023.01); H01J 49/0004 (2013.01); G06T 2207/20104 (2013.01); G06T 2207/30024 (2013.01);
Abstract

An imaging mass spectrometry unit () executes predetermined analysis on each of a plurality of micro areas set in a two-dimensional measurement region on a sample or a three-dimensional measurement region in a sample to acquire spectrum data. A clustering execution section () classifies spectrum data for a plurality of measurement points obtained for a reference sample into any of a plurality of clusters. A clustering model information storage section () stores a clustering model obtained by clustering processing. A segmentation execution section () classifies respective spectral data for a plurality of measurement points obtained for a sample other than a reference sample using a clustering model, and a spatial distribution image creation section () creates a segmentation image obtained by partitioning a two-dimensional or three-dimensional image into a plurality of small regions on the basis of a result of the classification.


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