The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2024
Filed:
Dec. 29, 2020
Boe Hyundai Lcd Inc., Beijing, CN;
Boe Technology Group Co., Ltd., Beijing, CN;
Shunan Zhang, Beijing, CN;
Haifeng Sheng, Beijing, CN;
Xuedong Zhang, Beijing, CN;
Hao Su, Beijing, CN;
BOE Hyundai LCD Inc., Beijing, CN;
BOE Technology Group Co., Ltd., Beijing, CN;
Abstract
Provided are a method and an apparatus for rechecking a defective product. The method includes: a display terminal receives sent image information of at least one detection image corresponding to the defective product (S). The image information includes: an ID of the at least one detection image, and defect information corresponding to the at least one detection image. The defect information includes: a defect type of a defect in the at least one detection image, and defect coordinates of the defect in the at least one detection image. The display terminal displays the at least one detection image that is pre-stored corresponding to the defective product and marks the defect information corresponding to the at least one detection image according to the image information (S).
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile