The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2024
Filed:
Oct. 28, 2021
National Chung Cheng University, Chiayi, TW;
Wei-Yen Hsu, Chiayi, TW;
Cheng-Han Tsai, Chia-yi County, TW;
NATIONAL CHUNG CHENG UNIVERSITY, Chiayi, TW;
Abstract
A single image deraining method is proposed. A wavelet transforming step processes an initial rain image to generate an i-th stage low-frequency rain image and a plurality of i-th stage high-frequency rain images. An image deraining step inputs the i-th stage low-frequency rain image to a low-frequency deraining model to output an i-th stage low-frequency derain image. A first inverse wavelet transforming step recombines the n-th stage low-frequency derain image with the n-th stage high-frequency derain images to form an n-th stage derain image. A weighted blending step blends a (n−1)-th stage low-frequency derain image with the n-th stage derain image to generate a (n−1)-th stage blended derain image. A second inverse wavelet transforming step recombines the (n−1)-th stage high-frequency derain images with the (n−1)-th stage blended derain image to form a (n−1)-th stage derain image, and sets n to n−1 and repeats the last two steps.