The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2024
Filed:
Jul. 14, 2021
Vianai Systems, Inc., Palo Alto, CA (US);
Vishal Inder Sikka, Los Altos Hills, CA (US);
Vianai Systems, Inc., Palo Alto, CA (US);
Abstract
An artificial intelligence (AI) model includes one or more feature models coupled to one or more observer models in a hierarchical fashion. The feature models are configured to process an input to detect different features within that input. The observer models are configured to analyze the operation of the feature models during processing of the input to generate various types of observations. One type of observation includes a natural language expression that conveys how various architectural and/or functional characteristics of a given feature model influence the processing of the input to detect features, thereby exposing the underlying mechanisms via which the given feature model operates.