The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2024
Filed:
Jul. 19, 2021
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventor:
Yuki Yoshimura, Tokyo, JP;
Assignee:
CANON KABUSHIKI KAISHA, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/01 (2006.01); G02B 27/00 (2006.01); G02B 27/01 (2006.01); G06V 40/19 (2022.01);
U.S. Cl.
CPC ...
G06F 3/013 (2013.01); G02B 27/0093 (2013.01); G02B 27/0101 (2013.01); G06V 40/19 (2022.01); G02B 2027/0138 (2013.01);
Abstract
There is provided a sight line position processing apparatus. A detection unit repeatedly detects a sight line position of a user. A first determination unit determines a reliability of the sight line position detected by the detection unit. A generation unit generates a statistical sight line position by calculating a statistical value for a plurality of sight line positions detected by the detection unit. The generation unit controls a number of sight line positions used to calculate one statistical value on the basis of the reliability.