The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2024
Filed:
Mar. 11, 2022
Intuit Inc., Mountain View, CA (US);
Yair Horesh, Kfar-Saba, IL;
Aviv Ben Arie, Ramat Gan, IL;
Intuit Inc., Mountain View, CA (US);
Abstract
Described herein are example implementations for generating a perturbation seed for the perturbation of electronic data. A system obtains a plurality of datapoints (with one or more statistics calculated from the plurality of datapoints to be perturbed based on a perturbation seed). The system calculates one or more metrics from the plurality of datapoints. The system also generates, for each of the one or more metrics, a rounded metric by rounding the metric. The system further generates the perturbation seed. Generating the perturbation seed includes hashing the one or more rounded metrics. Rounding a metric may be to a defined place value (such as the second most significant place value), and a binary output of hashing the one or more rounded metrics may be converted to a number. The system may perturb one or more statistics based on the perturbation seed and output the one or more perturbed statistics.