The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2024

Filed:

Oct. 29, 2021
Applicant:

Volkswagen Aktiengesellschaft, Wolfsburg, DE;

Inventors:

Elnaz Vahedforough, San Jose, CA (US);

Adrienne Othon, Kensington, CA (US);

Jens Langenberg, Redwood City, CA (US);

Pratik P. Brahma, Belmont, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 18/00 (2023.01); G06F 18/214 (2023.01); G06N 20/00 (2019.01); G06T 7/136 (2017.01); G06T 19/00 (2011.01);
U.S. Cl.
CPC ...
G06F 18/2148 (2023.01); G06N 20/00 (2019.01); G06T 7/136 (2017.01); G06T 19/003 (2013.01);
Abstract

A method is provided. The method includes generating a set of candidate training data based on a simulated environment and a first set of environmental parameters. The method also includes training a machine learning model based on the set of candidate training data. The method further includes obtaining a set of segmentations based on the machine learning model and a set of test data. The method further includes determining whether a mean intersection-over-union (MIOU) of the set of segmentations has increased by more than a threshold change. The method further includes generating a next set of candidate training data based on the simulated environment and a second set of environmental parameters for the simulated environment, in response to determining that the MIOU has increased by more than the threshold MIOU amount.


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