The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2024

Filed:

Aug. 29, 2022
Applicant:

Kabushiki Kaisha Yaskawa Denki, Kitakyushu, JP;

Inventors:

Tadashi Okubo, Kitakyushu, JP;

Toshinobu Kira, Kitakyushu, JP;

Junya Hisamatsu, Kitakyushu, JP;

Minoru Koga, Kitakyushu, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G07C 5/08 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0751 (2013.01); G06F 11/0739 (2013.01); G07C 5/0808 (2013.01);
Abstract

An abnormality determination system includes first data acquisition circuitry configured to acquire time-series data relating to an operation of a device, sample data creation circuitry configured to create sample data based on abnormality time-series data which the first data acquisition circuitry acquires while an abnormality occurs in the operation of the device, and first abnormality determination circuitry configured to determine the abnormality in the operation of the device based on the time-series data and the sample data.


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