The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2024

Filed:

Jun. 22, 2022
Applicant:

University of Florida Research Foundation, Incorporated, Gainesville, FL (US);

Inventors:

Domenic J. Forte, Gainesville, FL (US);

Nima Maghari, Gainesville, FL (US);

Michael Levin, Gainesville, FL (US);

Sreeja Chowdhury, Gainesville, FL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05F 1/56 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G05F 1/56 (2013.01); G01R 31/2851 (2013.01);
Abstract

A method and system are directed to designing a low-dropout regulator (LDO) circuit and using the LDO circuit to detect recycled counterfeit integrated circuits. The LDO circuit includes, in part, a reference path circuit and a stressed path circuit. Each of the reference path circuit and the stressed path circuit is coupled to a control signal that can enable the corresponding path circuit for the LDO. LDO parameters can then be measured while the reference path circuit and the stressed path circuit is enabled respectively. The difference between the LDO parameters measured while the reference path circuit is enabled and while the stressed path circuit is enabled is used to determine if an integrated circuit comprising the LDO circuit is a recycled counterfeit.


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