The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2024

Filed:

Jun. 14, 2022
Applicant:

Chengdu University of Technology, Chengdu, CN;

Inventors:

Xianlin Shi, Chengdu, CN;

Keren Dai, Chengdu, CN;

Jin Deng, Chengdu, CN;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 13/90 (2006.01); G01C 5/00 (2006.01); G01S 13/88 (2006.01);
U.S. Cl.
CPC ...
G01S 13/9023 (2013.01); G01C 5/005 (2013.01); G01S 13/885 (2013.01); G01S 13/9017 (2013.01);
Abstract

A method for calculating a sensitivity of a displacement of Synthetic Aperture Radar (SAR) along line-of-sight direction to a slope gradient and a slope aspect is provided, comprising: obtaining SAR data and Digital Elevation Model (DEM) data covering slope bodies, and extracting a local incident angle of an image by utilizing a satellite side-looking imaging principle; carrying out geometric distortion on the slope bodies under ascending and descending orbits by utilizing the local incident angle, to obtain specific locations of geometric distortion areas under ascending and descending orbit; calculating sensitivities of detections to changes of the slope gradient and the slope aspect under ascending and descending orbits according to the extracted parameter information of the SAR satellite in ascending and descending orbits and satellite heights, and dividing a sensitivity distribution by combining the sensitivity and the specific locations of the geometric distortion.


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