The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2024

Filed:

Mar. 28, 2023
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Michael Livshitz, Rockville, MD (US);

Mingjian Yan, Gaithersburg, MD (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 13/58 (2006.01); G01S 17/58 (2006.01);
U.S. Cl.
CPC ...
G01S 13/584 (2013.01); G01S 17/58 (2013.01);
Abstract

Methods, devices and instruction-carrying storage operate to track a target object over time and space. The tracking techniques involve obtaining a point cloud of reflection points at time n, a target from time n−1, state information including previous location information for the target and previous group distribution for previous reflection points associated with the target at time n−1; predicting a location of the target at time n based on the state information; determining a gate around the target and which of the multiple reflection points are within the gate; determining, for each of the multiple reflection points determined to be within the gate, a likelihood that the corresponding reflection point is associated with the target; determining current group distribution for the reflection points determined to likely be associated with the target; and outputting the determined current group distribution and current location information of the target.


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