The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2024

Filed:

Jul. 27, 2023
Applicant:

Siemens Healthcare Gmbh, Erlangen, DE;

Inventors:

Mario Zeller, Erlangen, DE;

Adam Kettinger, Erlangen, DE;

Assignee:

Siemens Healthineers AG, Erlangen, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); G01R 33/48 (2006.01); G01R 33/56 (2006.01); G01R 33/561 (2006.01);
U.S. Cl.
CPC ...
G01R 33/5611 (2013.01); G01R 33/4818 (2013.01); G01R 33/5608 (2013.01); G01R 33/5616 (2013.01);
Abstract

A technique for slice-specific correction of scan data recorded for at least two slices simultaneously of an examination object via an EPI-SMS is provided. The technique comprises recording slice separation reference scan data, generating scan data that is to be corrected, and recording phase-encoded navigator signals simultaneously for the at least two slices after an RF excitation pulse radiated into the examination object and before the recording of scan data to be corrected. The at least one navigator signal is recorded for each possible polarity and different phase-encoding of the navigator signals that is used. The technique further comprises separating the navigator signals simultaneously recorded for the at least two slices into single-slice navigator signals using the slice separation reference scan data, determining slice-specific correction data from the single-slice navigator signals, and correcting scan data that is to be corrected by means of the slice-specific correction data.


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Zeller, Mario. (2024). Method for slice-specific correction of scan data recorded for at least two slices simultaneously by means of an echo-planar simultaneous multi-slice technique (U.S. Patent No. 12025686). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12025686

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