The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2024
Filed:
Nov. 15, 2022
Ets Lindgren Inc., Cedar Park, TX (US);
Zhong Chen, Cedar Park, TX (US);
ETS Lindgren Inc., Cedar Park, TX (US);
Abstract
A method, system and apparatus for compensating for non-ideal isotropic behavior of a field probe are disclosed. A method includes, during a calibration procedure, for each of a plurality of positions of the field probe relative to a source, each position denoted by a set of angles (θ,ϕ), performing the following steps: measuring a field by the sensors of the probe, storing the measurements and the set of angles (θ,ϕ) for each measurement, computing a correction factor for the set of angles (θ,ϕ) based on the measurement, and storing the correction factors. During a measurement procedure, each sensor measures a component of the field. A set of angles is determined based on the sensor measurements, and a correction factor is determined based on the set of angles. The correction factor may then be multiplied by the sensor measurements to obtain the corrected field measurements.