The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2024
Filed:
Jul. 12, 2021
Fujifilm Corporation, Tokyo, JP;
Kazuhiro Hirota, Kanagawa, JP;
Yoshihiro Seto, Kanagawa, JP;
Takeya Meguro, Kanagawa, JP;
Kaku Irisawa, Kanagawa, JP;
Hirotaka Watano, Kanagawa, JP;
Taiji Iwasaki, Kanagawa, JP;
Tatsuyuki Denawa, Kanagawa, JP;
Haruyasu Nakatsugawa, Kanagawa, JP;
FUJIFILM CORPORATION, Tokyo, JP;
Abstract
A management system including at least one processor, wherein the processor is configured to acquire a captured image obtained by imaging an outer surface of each of plural sample containers which contains a sample and in which discrimination information for discriminating a subject from whom the sample is collected is given to the outer surface, and associate a test result related to the sample contained in each of the sample containers with a test order in which information of a discrimination image including the discrimination information is registered in advance for each subject, based on the captured image and the test order.