The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2024
Filed:
Jul. 17, 2020
Hitachi High-tech Corporation, Tokyo, JP;
Riku Tamura, Tokyo, JP;
Yuichiro Hashimoto, Tokyo, JP;
Yuka Sugawara, Tokyo, JP;
Hiroyuki Yasuda, Tokyo, JP;
HITACHI HIGH-TECH CORPORATION, Tokyo, JP;
Abstract
There is provided a specimen analyzer that can measure carry-over without degrading a specimen processing capability. A specimen analyzer according to the present invention measures a first sample including a first specimen and a first internal reference material, subsequently measures a second sample including a second specimen and a second internal reference material, and calculates an amount of the second specimen included in the second sample using an amount of the first internal reference material measured when the first sample has been measured and an amount of the second internal reference material measured when the second sample has been measured.