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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12025602 B1

PDFFull Text
Date of Patent:
Jul. 02, 2024

Filed:

Jan. 08, 2020

Autonomous crop monitoring system and method

Applicant:

Agroscout Ltd., Misgav, IL;

Inventors:

Simcha Shore, Eshchar, IL;

Ilan Ehrenfeld, Ariel, IL;

Ido Bar-Av, Moshav Yevul, IL;

Shahar Harari, Tel Aviv, IL;

Assignee:

AgroScout Ltd., Misgav, IL;

Attorney:

PEARL COHEN ZEDEK LATZER BARATZ LLP

Primary Examiner:

Gregory M Desire

Int. Cl.
CPC ...
G01N 33/00 (2006.01); A01G 13/00 (2006.01); A01N 25/00 (2006.01); B64C 39/02 (2023.01); G06K 9/00 (2022.01); G06V 20/20 (2022.01); B64U 101/00 (2023.01); G06Q 50/02 (2012.01);
U.S. Cl.
CPC ...
G01N 33/0098 (2013.01); A01G 13/00 (2013.01); A01N 25/00 (2013.01); B64C 39/024 (2013.01); G06V 20/20 (2022.01); B64U 2101/00 (2023.01); G06Q 50/02 (2013.01);
Abstract

A system for autonomous crop monitoring, the system comprising a mobile platform having one or a plurality of imaging devices configured to autonomously travel a path to scan a plurality of inspection regions in a field of crop and obtain images of the inspection regions; and a processor configured to analyze the acquired images to detect an agricultural condition that requires attention (ACRA) and determine the location of that ACRA.

Find Patent Forward Citations

Shore, Simcha. (2024). Autonomous crop monitoring system and method (U.S. Patent No. 12025602). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12025602

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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