The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2024

Filed:

Mar. 07, 2022
Applicant:

The Boeing Company, Chicago, IL (US);

Inventors:

Fei Cai, Edmonds, WA (US);

Richard Calawa, Edmonds, WA (US);

Assignee:

The Boeing Company, Chicago, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/88 (2006.01); B23K 26/70 (2014.01);
U.S. Cl.
CPC ...
G01N 21/8851 (2013.01); B23K 26/707 (2015.10); G01N 2021/8887 (2013.01); G01N 2201/022 (2013.01); G01N 2201/062 (2013.01); G01N 2201/08 (2013.01);
Abstract

The present disclosure provides an inspection system and method for inspecting an optical surface of a laser scanner, the system including a directional optical source and an optical detector. The method includes moving one of the laser scanner or the inspection system to a position in which a beam axis of the directional optical source extends across but does not intersect the optical surface, between the optical surface of and the optical detector. The method further includes emitting a light beam from the directional optical source, across the optical surface so that light from the light beam is incident on debris disposed on the optical surface. The method further includes collecting the light at the optical detector to form an image that indicates presence of the debris on the optical surface of the laser scanner; and generating feedback to alert a user of the presence of the debris.


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