The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2024

Filed:

Jun. 29, 2022
Applicant:

Fraunhofer-gesellschaft Zur Förderung Der Angewandten Forschung E.v., Munich, DE;

Inventors:

Peter Hartmann, Dresden, DE;

Tobias Baselt, Dresden, DE;

Wulf Grählert, Dresden, DE;

Oliver Throl, Dresden, DE;

Philipp Wollmann, Dresden, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/27 (2006.01); G01J 3/50 (2006.01); G01N 21/47 (2006.01); G01N 21/84 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8422 (2013.01); G01J 3/50 (2013.01); G01N 21/27 (2013.01); G01N 21/47 (2013.01); G01N 2021/8427 (2013.01); G01N 2201/0846 (2013.01);
Abstract

In the method for optical monitoring and/or determination of properties on samples, monochromatic electromagnetic radiation with a predetermined wavelength is sequentially directed from several radiation sources onto a sample influenced by an electronic evaluation unit. The respective intensity specific to the wavelength of the electromagnetic radiation scattered and/or reflected by the sample is detected by at least one detector and fed to the electronic evaluation unit for spectrally resolved evaluation in order to use it to monitor and/or determine properties of the respective sample.


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