The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2024
Filed:
Dec. 02, 2021
Olympus Corporation, Tokyo, JP;
Tomoko Sato, Hachioji, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
An optical property measurement method includes: measuring, by first measurement, optical intensity of backscattering from a measurement target object when light is beamed to the measurement target object; calculating an attenuation coefficient in a depth direction of the measurement target object based on a measurement result of the first measurement; measuring, by second measurement that is different from the first measurement, optical intensity of backscattering from the measurement target object when light is beamed to the measurement target object; and calculating a scattering coefficient and an absorption coefficient in the depth direction of the measurement target object based on a measurement result of the second measurement by using a value of the calculated attenuation coefficient as a limiting condition.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile