The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2024
Filed:
Nov. 15, 2021
Applicant:
Leica Geosystems Ag, Heerbrugg, CH;
Inventors:
Josef Müller, Oberegg, CH;
Jochen Scheja, Hohenems, AT;
Oliver Faix, Diepoldsau, CH;
Thomas Bösch, Lustenau, AT;
Claudio Iseli, Au, CH;
Assignee:
LEICA GEOSYSTEMS AG, Heerbrugg, CH;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 25/00 (2006.01); G01C 15/00 (2006.01); G01C 15/06 (2006.01); G06T 7/70 (2017.01); G06T 7/80 (2017.01);
U.S. Cl.
CPC ...
G01C 25/00 (2013.01); G01C 15/002 (2013.01); G01C 15/06 (2013.01); G06T 7/70 (2017.01); G06T 7/80 (2017.01);
Abstract
A calibrating method and system for an auxiliary measuring instrument which is designed to form together with a ground-based, stationary, surveying device having range-and-direction measuring functionality, a total station, a system for surveying and/or staking out object points. The auxiliary measuring instrument including a body which has a code for determining the orientation by using a pivoting movement of the body about a resting contact end of the auxiliary measuring instrument.