The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2024
Filed:
Apr. 06, 2021
Applicant:
Denso Corporation, Kariya, JP;
Inventors:
Toshio Nomura, Kariya, JP;
Shigehiro Muto, Kariya, JP;
Assignee:
DENSO CORPORATION, Kariya, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 21/00 (2006.01); H04W 4/40 (2018.01);
U.S. Cl.
CPC ...
G01C 21/387 (2020.08); G01C 21/3822 (2020.08); G01C 21/3833 (2020.08); G01C 21/3841 (2020.08); H04W 4/40 (2018.02);
Abstract
In a probe data evaluation apparatus, probe data are collected from a vehicle. Provisional map data are generated based on the collected probe data. The generated provisional map data are compared with reference map data, to provide a comparison result. Whether or not to adopt the collected probe data is determined based on the comparison result.
Nomura, Toshio. (2024). Probe data evaluation apparatus, and storage medium storing probe data evaluation program product (U.S. Patent No. 12025464). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12025464
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