The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2024

Filed:

Feb. 15, 2023
Applicant:

Virtek Vision International Inc, Waterloo, CA;

Inventor:

Kurt D. Rueb, Kitchener, CA;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01C 11/02 (2006.01); G01B 11/14 (2006.01); G03B 21/20 (2006.01);
U.S. Cl.
CPC ...
G01C 11/02 (2013.01); G01B 11/14 (2013.01); G03B 21/2033 (2013.01);
Abstract

A method and system for controlling projection of optical indicators on a worksurface is disclosed. A projection device for projecting a first optical indicator and a second optical indicator onto a worksurface is provided. A measurement system monitors a work area in which the worksurface is disposed. The measurement system locates a control object within the work area and identifies a marker disposed on the control object. The measurement system monitors a first disposition and a second disposition of the control object. The projection device projects the first optical indicator onto the worksurface and the projection device projects the second optical indicator onto the worksurface in response to manipulation of the control object between the first disposition and the second disposition as detected by said measurement system.


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