The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2024

Filed:

Aug. 24, 2021
Applicant:

The Curators of the University of Missouri, Columbia, MO (US);

Inventors:

Genda Chen, Rolla, MO (US);

Jie Gao, Rolla, MO (US);

Chuanrui Guo, Rolla, MO (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 5/353 (2006.01); G01B 9/02056 (2022.01);
U.S. Cl.
CPC ...
G01B 9/02058 (2013.01); G01D 5/353 (2013.01); G01B 2290/25 (2013.01);
Abstract

A miniature, micrometer-accuracy, three-dimensional (3D) position-to-optical displacement sensor that has at least one extrinsic Fabry-Perot interferometer (EFPI) in Z direction and a series of plasmonic metasurface resonators with distinctive wavelength-selective characteristics in X and Y directions. The interferometer comprises at least one single mode optic fiber for light propagation, and a substrate mirror to create a light interference fringe as a function of distance between the mirror and the distal end of the optic fiber. Each plasmonic resonator is capable of modifying the substrate mirror and comprises an array of multiple unit nanostructure unit cells that are arranged in a two-dimensional (2D) square lattice or array in the X-Y plane. The nanostructure unit cells are preferably inscribed in the top layer of a three-layer thin film via the focused ion beam (FIB).


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