The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2024

Filed:

Dec. 06, 2019
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Eijiro Shibusawa, Yokohama, JP;

Kazuo Shimizu, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/25 (2006.01); F24C 7/08 (2006.01); G06T 7/579 (2017.01); G06T 17/00 (2006.01);
U.S. Cl.
CPC ...
G01B 11/2518 (2013.01); F24C 7/08 (2013.01); G06T 7/579 (2017.01); G06T 17/00 (2013.01); G06T 2207/10028 (2013.01);
Abstract

A three dimensional (3D) measuring device. The 3D measuring device includes a rotational supporting shaft, a supporting frame configured to support the supporting shaft, a beam irradiator arranged at the supporting shaft for irradiating beam of light onto an object, a capturer arranged at the supporting shaft to be at a distance from the beam irradiator and configured to capture the beam projected on the object, and at least one processor configured to control rotation of the supporting shaft and obtain a 3D shape of the object based on image information obtained by the capturer as the supporting shaft is rotated.


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