The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2024

Filed:

Mar. 16, 2020
Applicant:

Hexagon Metrology Kabushiki Kaisha, Sagamihara, JP;

Inventors:

Masahiro Suzuki, Hamamatsu, JP;

Satoshi Suzuki, Hamamatsu, JP;

Andreas Hieble, Waldburg, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01); G01B 5/008 (2006.01); G01B 11/00 (2006.01); G01B 21/04 (2006.01); G05B 19/401 (2006.01);
U.S. Cl.
CPC ...
G01B 11/24 (2013.01); G01B 5/008 (2013.01); G01B 11/005 (2013.01); G01B 21/042 (2013.01); G05B 19/401 (2013.01); G05B 2219/37008 (2013.01); G05B 2219/37198 (2013.01); G05B 2219/50252 (2013.01);
Abstract

A method for calibrating a CNC processing apparatus is provided that can significantly reduce the amount of operation time required for sensor calibration. A method of the present invention for calibrating a non-contact sensor in a CNC processing apparatusincludes a first step, a second step and a third step. In the first step, the center coordinates of a reference instrument are measured with a contact probe and thereby the machine coordinates of the center of the reference instrument are determined. In the second step, after a non-contact sensoris mounted onto a spindle, the center coordinates of the reference instrument are measured only one time with the non-contact sensor, and thereby the non-contact sensor coordinates of the center of the reference instrument are determined. In the third step, calculations are made to determine the amount of displacement required to bring the non-contact sensor coordinates obtained in the second step into agreement with the machine coordinates obtained with the contact probe in the first step.


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