The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2024
Filed:
Jun. 14, 2019
Dentsply Sirona Inc., York, PA (US);
DENTSPLY SIRONA INC., York, PA (US);
Abstract
The invention relates to an optical measuring method for the three-dimensional detection of the surface of an object using an optical recording unit. The optical recording unit is moved relative to the object during a first measurement time interval, height maps are successively detected by the recording unit at a recording frequency, and at least some of the detected height maps are each added to an overall height map and displayed. The recording frequency is regulated by control signals during the measurement time interval. The control signals are generated spaced apart in time and for the purposes of producing each control signal, a statistic for the quality of the height map is determined for the respectively last detected height image and used for producing the control signal. The statistic is the overall intensity and/or the maximum intensity and/or the contrast and/or the number of extracted data points and/or a quality of extracted data points and/or the signal-to-noise ratio and/or the contrast of an additionally generated color image.