The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2024

Filed:

Oct. 11, 2019
Applicant:

Mitsubishi Heavy Industries, Ltd., Tokyo, JP;

Inventors:

Junpei Yamaguchi, Tokyo, JP;

Masanobu Tsutsui, Tokyo, JP;

Haruki Mori, Shiga, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/00 (2006.01); B25J 13/02 (2006.01); B25J 13/08 (2006.01);
U.S. Cl.
CPC ...
G01B 11/005 (2013.01); B25J 13/02 (2013.01); B25J 13/089 (2013.01); G05B 2219/40601 (2013.01);
Abstract

An object is to, in a case where it is necessary to share a common coordinate system by a plurality of position measurers, reduce an error in the coordinate system between the position measurers. A position measurement system allows a plurality of laser trackers to share position measurement of a plurality of measurement points. The laser tracker measures three coordinate definition targets for defining a coordinate system of the measurement points, defines a work coordinate system from measurement results of the three coordinate definition targets, and measure the measurement points allocated to the laser tracker using the defined work coordinate system. The other laser trackers and measure the measurement points allocated to the other laser trackers and using correction vectors based on a positional relationship between the laser tracker and the laser trackers and obtained in advance, and the work coordinate system defined by the one laser tracker.


Find Patent Forward Citations

Yamaguchi, Junpei. (2024). Position measurement system and position measurement method (U.S. Patent No. 12025422). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12025422

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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